Cores Directory

Search for the resources you need to answer your research questions.

43 results found

Listing of research core items

  1. Instrument/equipment

    Ion mill

    The Hitachi IM4000 can be used for cross-sectioning samples (usually for SEM viewing) or for polishing surfaces.

    Sungwoo Sohn, PhD

    Associate Director of Facilities
  2. Instrument/equipment

    Iridium sputtering tool

    Iridium is useful for coating samples before electron microscopy.

    Sungwoo Sohn, PhD

    Associate Director of Facilities
  3. Instrument/equipment

    Leica SP5 confocal microscope

    Leica SP5 confocal microscope

    Mateus Guerra, PhD

    Primary contact Associate Director
  4. Instrument/equipment

    Leica SP8 Gated STED 3X super resolution

    Leica SP8 Gated STED 3X Super Resolution microscope

    Mateus Guerra, PhD

    Primary contact Associate Director
  5. Instrument/equipment
    Yellow dog chewing a rawhide

    Lorem Ipsum Offering

    This is a mock-up of an maximal offerings page.

  6. Instrument/equipment

    Metrology

    Zygo 3D Optical Profiler, Olympus Optical Microscope, and Celestron Stereo Microscope

    Located within West Campus Cleanroom

    Lauren McCabe, PhD

    Primary contact
  7. Instrument/equipment

    Microtome

    A microtome makes possible the sectioning of soft material for TEM analysis.

    Sungwoo Sohn, PhD

    Associate Director of Facilities
  8. Instrument/equipment

    Photolithography

    Suss UV Mask Aligner and Heidelberg μMLA Maskless Aligner

    Located within West Campus Cleanroom

    Lauren McCabe, PhD

    Primary contact
  9. Instrument/equipment

    Sputtering and evaporation

    Sputtering and evaporation

    Located within West Campus Cleanroom

    Lauren McCabe, PhD

    Primary contact
  10. Instrument/equipment

    Stellaris 8 DIVE multiphoton/confocal microscope

    Stellaris 8 DIVE multiphoton/confocal microscope

    Mateus Guerra, PhD

    Primary contact Associate Director
  11. Instrument/equipment

    Structural Science Facility

    We offer a range of instruments for diffraction, scattering, and imaging.

    Brandon Mercado, PhD

    Director
  12. Instrument/equipment

    Stylus profilometer

    The Bruker Dektak XT stylus profilometer measures step heights, surface profiles and roughness using a stylus with a 12.5 um radius tip. 

    Sungwoo Sohn, PhD

    Associate Director of Facilities