Cores Directory

Search for the resources you need to answer your research questions.

40 results found

Listing of research core items

  1. Instrument/equipment

    Imaris image analysis workstations

    Imaris imaging analysis workstations

    Mateus Guerra, PhD

    Primary contact
  2. Instrument/equipment

    Ion mill

    The Hitachi IM4000 can be used for cross-sectioning samples (usually for SEM viewing) or for polishing surfaces.

    Sungwoo Sohn, PhD

    Associate Director of Facilities
  3. Instrument/equipment

    Iridium sputtering tool

    Iridium is useful for coating samples before electron microscopy.

    Sungwoo Sohn, PhD

    Associate Director of Facilities
  4. Instrument/equipment

    Leica SP5 confocal microscope

    Leica SP5 confocal microscope

    Mateus Guerra, PhD

    Primary contact Associate Director
  5. Instrument/equipment

    Leica SP8 Gated STED 3X super resolution

    Leica SP8 Gated STED 3X Super Resolution microscope

    Mateus Guerra, PhD

    Primary contact Associate Director
  6. Instrument/equipment
    Yellow dog chewing a rawhide

    Lorem Ipsum Offering

    This is a mock-up of an maximal offerings page.

  7. Instrument/equipment

    Metrology

    Metrology tools offer the ability to characterize thin films, including via an optical microscope, spectral reflectometry, ellipsometry, stylus profiler, and optical profilometer.

    Located within Yale Cleanroom Facilities
  8. Instrument/equipment

    Microtome

    A microtome makes possible the sectioning of soft material for TEM analysis.

    Sungwoo Sohn, PhD

    Associate Director of Facilities
  9. Instrument/equipment

    Stellaris 8 DIVE multiphoton/confocal microscope

    Stellaris 8 DIVE multiphoton/confocal microscope

    Mateus Guerra, PhD

    Primary contact Associate Director
  10. Instrument/equipment

    Structural Science Facility

    We offer a range of instruments for diffraction, scattering, and imaging.

    Brandon Mercado, PhD

    Director
  11. Instrument/equipment

    Stylus profilometer

    The Bruker Dektak XT stylus profilometer measures step heights, surface profiles and roughness using a stylus with a 12.5 um radius tip. 

    Sungwoo Sohn, PhD

    Associate Director of Facilities
  12. Core/facility
    Benches with microscopes

    West Campus Imaging Core

    We offer access to and training in the use of a variety of confocal and epifluorescence microscopes as well as light-sheet, laser microdissection, and atomic force microscopy.