Ion mill
About the instrument
The Hitachi IM4000 ion mill can be used for cross-sectioning samples (usually for scanning electron microscope [SEM] viewing) or for polishing surfaces. This ion mill uses a knife edge to mask the ion beam, creating a straight cut. The sample stage is easily reconfigured for polishing the sample by milling at a glancing angle. The polishing mode can also be used for thinning transmission electron microscope (TEM) samples. Operating at up to 6 kV, the ion current is much higher than that of the Fischione 1050, but the spot size is also much larger.
Available to Yale researchers & external researchers