West Campus Materials Characterization Core

Please carefully review our policies. Download standard operating procedures for core instruments.

To acknowledge our core, please add “We acknowledge Yale West Campus Materials Characterization Core” to your publications.

In the experimental section of your manuscripts, please cite specific instruments, plus more detailed descriptions if required. See the below examples.

XPS 

PHI VersaProbe III: “XPS spectra were collected using monochromatic 1486.7 eV Al Kα X-ray source on a PHI VersaProbe III X-ray Photoelectron Spectrometer with a 0.47 eV spectral resolution. Spectral energy and linearity have been calibrated using Cu 2p3/2 (932.62 eV), Ag 3d5/2 (368.21 eV), and Au 4f7/2 (83.96 eV) peaks collected on cleaned copper, silver, and gold foils.”

UPS installed on PHI VersaProbe II XPS system: “UPS spectra were collected using He Iα (21.22 eV) source on a PHI VersaProbe II XPS system; spectra were referenced to the Fermi level, which was determined from a UPS spectrum of a clean gold foil. For work function measurements, a -5 V bias was applied to the sample so that the cut-off edge on the left side of valence band can be collected.”

XRD 

Rigaku SmartLab XRD: “The XRD instrument includes a Cu Kα source with a beam energy of 8.04 keV, corresponding to an X-ray wavelength of 1.5406 Å.”

Rigaku 2D detector: HyPix-3000, pixels: 385 x 775

SEM

Hitachi SU8230 CFE SEM with BRUKER XFlash 5060FQ Annual EDS detector

FIB-SEM

Helios G4 UX system with UltraDry MANUAL EDS and LUMIS EBSD detector

PPMS

PPMS® DynaCool™

XRF

Rigaku ZSX Primus II XRF: “The wavelength dispersive X-ray fluorescence (WDXRF) spectrometer adopts Rh Kα source with a beam energy of 20.2161 keV, corresponding to an X-ray wavelength of 0.6147 Å.”

See a list of our publications.