Aberration-Corrected Electron Microscopy (ACEM) Core

The new Spectra Ultra TEM microscope is under smooth installation. All potential users that plan to operate the new advanced TEM, please register in FOM (fom.yale.edu) system to initiate the process. 

The Aberration Corrected Electron Microscopy Core, or ACEM, is a cutting-edge, university-wide shared user research facility that works in partnership with other core facilities at Yale. We serve the Yale community and also the larger community through collaboration efforts. Our core's focus is cutting-edge and high-throughput capability in TEM, SEM and FIB. 

We offer a variety of techniques, including X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), electron diffraction (ED), nano-beam electron diffraction (NBED), 4D-STEM, convergent beam diffraction (CBED), EELS, EDX, electron holography, in-situ biasing/heating/cooling, CL, holography, Lorentz mode for imaging magnetic materials, i-DPC, and tomography. 

Currently, we have a space on Yale West Campus with one advanced TEM (Spectra Ultra X), one regular TEM (pending funding support), and one advanced FIB dual-beam system. In the future, we will further expand the lab by getting space through the PSEB project. 

Our core will collaborate with other TEM facilities to provide Yale researchers with seamless access for advanced TEM capabilities. Students interested in getting involved in advanced TEM techniques are welcome to contact Dr. Yang for potential research opportunities.