Aberration-Corrected Electron Microscopy (ACEM) Core

The new Spectra Ultra TEM microscope is ready for user training. All potential users that plan to operate the new advanced TEM, please register in PPMS system (https://ppms.us/yale/login/?pf=42) to initiate the process. 

The Aberration Corrected Electron Microscopy Core, or ACEM, is a cutting-edge, university-wide shared user research facility that works in partnership with other core facilities at Yale. We serve the Yale community and also the larger community through collaboration efforts. Our core's focus is cutting-edge and high-throughput capability in TEM, SEM and FIB. 

We offer a variety of techniques, including X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), electron diffraction (ED), nano-beam electron diffraction (NBED), 4D-STEM, convergent beam diffraction (CBED), EELS, EDX, electron holography, in-situ biasing/heating/cooling, CL, holography, Lorentz mode for imaging magnetic materials, i-DPC, and tomography. 

We have space on Yale West Campus with one advanced TEM (Spectra Ultra X) and one advanced FIB dual-beam system.

Please find more information about West Campus here. To get access, submit the access form on the West Campus Security page to get building access. When asked for the work location, enter ESI, Bldg 810, Rm A105 and Rm A119.

Core Leadership
Shize Yang, Director, ACEM Core
shize.yang@yale.edu; (203)737-3268
Ben Myers, Director of Research Cores (Central) 
b.myers@yale.edu; (203)436-4559
Core Business Operations
Karen Milner, Financial Analyst (billing)
karen.milner@yale.edu; (203) 432-0060
Harley Pretty, Lead Administrator
harley.pretty@yale.edu; (203) 436–4860