Stylus profilometer
About the instrument
The Bruker Dektak XT stylus profilometer measures step heights, surface profiles and roughness using a stylus with a 12.5 um radius tip. Step heights can range from ~5 nm to 1 mm, with scan lengths up to 55mm. The stylus force is usually set to 10 mg, but can be set below 1 mg for soft materials. 3D imaging (using 2D scans) can be done, although this is rather slow compared to an optical profilometer.
Available to Yale researchers & external researchers