Stylus profilometer

Sungwoo Sohn, PhD

Associate Director of Facilities

About the instrument

Scientific apparatus
Bruker Dektak XT stylus profilometer

The Bruker Dektak XT stylus profilometer measures step heights, surface profiles and roughness using a stylus with a 12.5 um radius tip. Step heights can range from ~5 nm to 1 mm, with scan lengths up to 55mm. The stylus force is usually set to 10 mg, but can be set below 1 mg for soft materials. 3D imaging (using 2D scans) can be done, although this is rather slow compared to an optical profilometer.

 

 

 

 

Available to Yale researchers & external researchers