X-ray and electron diffraction

Learn more about our instruments below.

Pilatus3R HPC on a 007 VHF+Arc)Sec X-ray source
Rigaku CCD on a 007HF+ X-ray source
Rigaku CCD on a 007HF+Arc)Sec X-ray source
Rigaku MiniFlex600 powder X-ray diffractometer
Rigaku XtaLAB Mini II with a hybrid pixel detector
Rigaku XtaLAB Synergy, Dualflex, HyPix-Arc 100
XtaLab Synergy-ED 

Pilatus3R HPC on a 007 VHF+Arc)Sec X-ray source 

Short name: 007c
Instrument location: KCL 7
Date of acquisition: October 2016 (Back to top)

The Pilatus3R 200KA detector on our Rigaku 007 HF+ rotating anode with VHF Arc)Sec optics is suitable for solving small molecule samples.
λ = 0.7107 Å

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Rigaku CCD on a 007HF+ X-ray source

Short name: 007a
Instrument location: KCL 7
Date of acquisition: October 2009 (Back to top)

The HyPix-6000HE hybrid pixel array detector on our Rigaku 007 HF+ rotating anode X-ray source with HF optics is suitable for solving small-molecule and protein structures by single-crystal X-ray diffraction. This instrument can also be used to screen crystals before sending them to an x-ray beam line at a synchrotron. 
λ = 1.5418 Å

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Rigaku CCD on 007HF+Arc)Sec X-ray source

Short name: 007b
Instrument location: KCL 7
Date of acquisition: June 2016 (Back to top)

The Rigaku Saturn 944HG CCD detector on our Rigaku 007 HF+ rotating anode X-ray source with HF Arc)Sec optics is suitable for solving small molecule samples. This instrument is run by CBIC staff. 
λ = 1.5418 Å

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Rigaku MiniFlex600 powder X-ray diffractometer

Short name: PXRD
Instrument location: KCL 7
Date of acquisition: December 2004 (Back to top)

This powder diffractometer can characterize crystallinity, crystal phases, and, in many cases, the identity of solid samples. Our instrument has a sealed-tube copper X-ray source, a scintillation counter with high dynamic range, and Bragg-Brentano geometry with slits providing high resolution for flat powder samples. 
λ = 1.5418 Å

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Rigaku XtaLAB Mini II with a hybrid pixel detector

Instrument location: KCL 7
Date of acquisition: May 2022 (Back to top)

The XtaLabMini II is a fully functional benchtop single-crystal X-ray diffractometer with a HyPix-Bantam semiconductor detector.
λ = 0.7107 Å

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Rigaku XtaLAB Synergy, Dualflex, HyPix-Arc 100

Short name: syn
Instrument location: KCL 7
Date of acquisition: January 2023 (Back to top)

Copper and silver X-ray sources are available. The HyPix Arc-100 curved image plate detector allows high dynamic range and collection out to a 2Θ angle of 144 degrees in a single image to yield high-resolution single-crystal data.

λ = 1.5418 or 0.5609 Å

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XtaLab Synergy-ED

Short name: mED
Instrument location: KCL 7
Date of acquisition: January 2025 (Back to top)

The Synergy-ED is a state-of-the-art electron diffractometer designed for microcrystal electron diffraction (microED) / 3D electron diffraction (3DED) experiments. It enables high-resolution structural analysis of nanocrystalline materials that are too small for conventional X-ray diffraction techniques.

Key features
Wavelength: Operates at an electron wavelength of ~0.0251 Å with a 200 kV accelerating voltage, providing high-resolution diffraction data.
Temperature range: Capable of measuring samples from room temperature down to 100 K, allowing for studies of temperature-dependent structural changes.
Viable grain size: Suitable for nanocrystals and microcrystals ranging from several hundred nanometers to less than 10 microns.
Sample types
The Synergy-ED is optimized for a broad range of crystalline materials, including:
* Small organic molecules (e.g., pharmaceuticals, natural products)
* Inorganic nanomaterials
* Metal-organic frameworks (MOFs) and zeolites
* Peptides and small proteins
* Polymers and hybrid materials
Applications
Pharmaceutical research: 
Polymorph studies: Determines different crystal forms of a compound, crucial for drug formulation and stability.
Phase transitions: Investigates temperature- or pressure-induced structural changes.
Materials science & nanotechnology:
Grain boundary analysis: Characterizes defects, interfaces, and grain orientations in polycrystalline materials.
Nanocrystalline and amorphous phase identification: Helps differentiate between ordered and disordered structures.
Heterogeneous sample analysis:
Sample mixtures: Can resolve and identify multiple crystalline phases within complex mixtures.
Solid-state chemistry: Provides insight into phase purity and composition.

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