Atomic force microscopy
Michael Rooks
Malone Engineering Center, room 003B
About the instrument
A Bruker Dimension Fastscan AFM provides atomic force microscopy in both air and fluids using the new “Peak Force” tapping mode as well as very high speed resonant tapping mode. In addition to the usual height and phase images, this instrument can calculate and map mechanical properties such as stiffness, modulus, and adhesion, with sample sizes as large as 200 mm. The AFM is equipped with both “Fastscan” and “Icon” scanning heads. The Fastscan head is easier to use and (of course) faster, while the Icon head has a larger range in X, Y, and Z.
Bruker Fastscan cheat sheet
Available to Yale researchers & external researchers
Specifications
Detailed specifications of the Fastscan AFM can be found here.
Rates
Rates in US$/hour unless otherwise noted
| Yale academic | External academic | Industrial | |
|---|---|---|---|
| SEM, Hitachi | 37 | 61 | 215 |
| AFM, Bruker | 35 | 58 | 105 |
| e-beam, EBPG | 100 | 165 | 300 |
| TEM, FEI Osiris | 100 | 165 | 300 |
| Ion mill, Fischione | 37 | 61 | 111 |
| Ion mill, Hitachi | 37 | 61 | 111 |
| Gold sputtering | 20 | 32 | 76 |
| Iridium sputtering | 20 | 32 | 76 |
| Microtome, Leica | 30 | 50 | 90 |
| HSQ resist, 4 ml | 25 ea | 41 ea | 75 ea |
| CSAR resist, 4 ml | 20 ea | 33 ea | 60 ea |
| Dektak profilometer | 10 | 16 | 45 |
Training & services
We have recorded a set of video clips for AFM training. You will be at the AFM, watching and copying the videos, while the instructor is nearby and available for questions. You will stop the videos at various times so that the instructor can check your progress. This seems to work pretty well, and people like going through the course at their own pace. You might take one hour, or you might take four hours. It’s up to you. Sign up for AFM training by using this appointment calendar.