Earth Materials Characterization Center (EMC2)
Building: Kline Geology Laboratory
About the core
The Earth Material Characterization Center (EMC2) consolidates materials physics equipment under one roof for students and postdocs to use to characterize samples.
Equipment overview
Electron microscopy and analysis
| Instrument | Contact | Building & room number |
|---|---|---|
| Hitachi ultra high-resolution Schottky scanning electron microscope (SEM) SU7000 | Zhenting Jiang | KGL 321 |
| Electron probe microanalyzer (EPMA) | Jim Eckert | KGL 327 |
Optical spectroscopy and X-ray
Contact for all: Zhenting Jiang
| Instrument | Building & room number |
|---|---|
| Raman spectrometer: Horiba-Jobin Yvon HR-800 | KGL 321 |
| Infrared spectrometer (FTIR): Excalibur FTS 3000 with UMA 600 microscope | KGL 315 |
| X-ray powder diffractometer: Rigaku-Miniflex 600MiniFlex | KGL 215 |
Sample preparation
Contact for all: Zhenting Jiang
| Instrument | Building & room number |
|---|---|
| M-Prep 6™ grinding/polishing machine | |
| Cressington high-vacuum carbon coater & metal evaporator | KGL 321 |
| Ion milling system IM4000 | KGL 321 |
| WELL diamond wire saws | |
| Computer-controlled pulsed near-IR laser cutter | KGL 215 |
High-temperature and/or high-pressure sample synthesis & rock deformation
| Instrument | Building & room number |
|---|---|
| Deltech vertical tube furnaces | KGL 317 |
High-pressure equipment
| Instrument | Building & room number |
|---|---|
| Griggs-type deformation apparatus | KGL 313 |
| 1000-ton Kawai-type multi-anvil apparatus | KGL 313 |
| Rotational Drickamer apparatus | KGL 313 |
Available to Yale researchers & external researchers
Instruments/equipment
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Bruker VERTEX 80v FT-IR Spectrometer
The VERTEX 80v delivers precision that meets the highest research standards.
Available to Yale researchers & external researchers -
Hitachi IM 4000 ion milling
The IM4000II supports both cross-section milling and flat-milling to prepare specimens, depending on the purpose.
Available to Yale researchers & external researchers -
Microprobe
An electron microprobe is a versatile instrument that bombards a small sample with a beam of high- energy electrons.
Available to Yale researchers & external researchers -
Raman micro-spectrometer
A Horiba Jobin-Yvon LabRam HR800 is used for registration of spectra of Raman scattering.
Available to Yale researchers & external researchers -
Ultra high-resolution SEM
The Hitachi SU7000 ultra high-resolution scanning electron microscope (SEM) excels in fast acquisition of multiple signals to address expansive SEM needs.
Available to Yale researchers & external researchers -
X-ray powder diffractometer (XRD)
The Rigaku MiniFlex 600 is a fifth-generation MiniFlex X-ray diffractometer (XRD) that can perform qualitative and quantitative analysis of polycrystalline materials.
Available to Yale researchers & external researchers
Contacts
Department of Earth and Planetary Sciences
210 Whitney Avenue
New Haven, CT 06511
Specialist
Faculty Director
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Core/facility
Aberration-Corrected Electron Microscopy (ACEM) Core
Our core's focus is cutting-edge and high-throughput capability in electron microscopy techniques, including TEM, SEM, and FIB.
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Core/facility
Advanced Instrumentation Development Center (AIDC)
Our mission stands at the nexus between hardware, computing, and data science.
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Core/facility
Advanced Prototyping Center at Wright Lab
The Advanced Prototyping Center is a fabrication and design support facility to help Yale researchers with custom instrumentation.