Earth Materials Characterization Center (EMC2)

Damanveer Grewal, PhD

Director

About the core

The Earth Material Characterization Center (EMC2) consolidates materials physics equipment under one roof for students and postdocs to use to characterize samples.

Equipment

Electron microscopy and analysis

  • Hitachi Ultra-High-Resolution Schottky scanning electron microscope SU7000 SEM, KGL 321
  • Electron Probe MicroAnalyzer EPMA, KGL 327

Optical spectroscopy and X-ray

Contact Zhenting Jiang

  • Raman spectrometer: ​Horiba-Jobin Yvon HR-800 Raman microscope, KGL 321
  • Infrared spectrometer (FTIR): Excalibur FTS 3000 with UMA 600 microscope, KGL 315
  • X-ray powder diffractometer Rigaku-Miniflex 600MiniFlex, KGL 215

Sample preparation

Contact Zhenting Jiang

  • M-Prep 6™ grinding/polishing machine
  • Cressington high-vacuum carbon coater and metal evaporator, KGL 321
  • Ion milling system IM4000, KGL 321
  • WELL diamond wire saws
  • Laser cutter: computer-controlled pulsed near-IR laser cutting tool, KGL 215

High-temperature and/or high-pressure sample synthesis and rock deformation

Deltech vertical tube furnaces, KGL 317

High-pressure equipment

  • Griggs-type deformation apparatus, KGL 313
  • 1000-ton Kawai-type multi-anvil apparatus, KGL 313
  • Rotational Drickamer apparatus, KGL 313

Available to Yale researchers & external researchers

Contacts

Department of Earth and Planetary Sciences
210 Whitney Avenue
New Haven, CT 06511

Director

Damanveer Grewal, PhD

Specialist

Jim Eckert, PhD Research Associate, Earth & Planetary Sciences

Specialist

Zhenting Jiang Research Associate/Lab Manager, SEM (TEM), FTIR and Raman, Earth & Planetary Sciences

Faculty Director

Maureen Long Bruce D. Alexander '65 Professor of Earth and Planetary Sciences