X-ray diffractometer
Frederick Walker
Becton rm 226
About the instrument
The Rigaku rotating anode X-ray diffractometer (XRD) in Becton room 226 is a workhorse for characterizing epitaxial thin films, polycrystalline films, and bulk single crystals.
The combination of a large X-ray flux from a 9 kW rotating anode and new, efficient X-ray optics make this diffractometer tool ideal for characterizing nanometer scale thin films and nanoparticles.
The facility also features the ICCD pdf-2 diffraction database of over 200,000 phases for unknown phase identification.
Available to Yale researchers & external researchers
Rates
Rates in US$/hour
| Yale academic | External academic | Industrial | |
|---|---|---|---|
| XRD | 20 | 32 | 200 |